The XAVIS TXM-XUi is a liquid-metal-jet multi-CT system for research applications. The supplier identifies battery, semiconductor, biological and nanoscale research among its uses.
The published table states an energy of 9 keV. Three-dimensional fluorescence mapping is listed as an option and should be specified separately where required.
Discuss the specimen material, preparation, imaging objective and required data before selecting a configuration. Research application examples describe areas of use; they do not establish a guaranteed result for an individual specimen.
Request a confirmed specification for the intended configuration, including the imaging mode and any optional fluorescence-mapping capability. Confirm resolution and field of view for the proposed imaging arrangement as part of the technical review.
Identify the region of interest, specimen dimensions and the type of information needed from the reconstructed data. Include constraints on specimen preparation and handling, along with the intended analysis workflow. Agree the evaluation criteria before comparing candidate configurations or interpreting a demonstration image.
Explore the XAVIS equipment range, XSCAN-9860AT semiconductor X-ray inspection and XSCAN C-series industrial X-ray inspection. See official TXM-XUi information for the supplier listing.
